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Squeezing the noise out of microscopes with quantum light

Measured microcantilever displacement signals for varying piezoelectric driving voltages, normalized against the standard quantum limit (shown as a dashed line).
Measured microcantilever displacement signals for varying piezoelectric driving voltages, normalized against the standard quantum limit (shown as a dashed line). Smaller signals are normally buried below the quantum limit but are measurable with enhanced sensitivity with quantum optical readout.

Scientific Achievement: Quantum sensing with entangled light enabled a 50% enhancement in the sensitivity of microcantilever beam displacement measurements.

Significance and Impact: These results enable high signal-to-noise-ratio off-resonant microscopies of nanoscale electronic dynamics in materials that can be performed orders of magnitude faster than classical microscopies.

DOI: 10.1103/PhysRevLett.124.230504

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