- By:
- Martin, Elijah H; Zafar, Abdullah ; Caughman, John B; Isler, Ralph C; Bell, Gary L
- Journal Name:
- Review of Scientific Instruments
- Volume:
- 87
- Issue Number:
- 11
- Publication Date:
- September 10, 2016
- Conference Name:
- High Temperature Plasma Diagnostics
- Conference Location:
- Madison, Wisconsin, United States of America
- View DOI Listing:
- https://doi.org/10.1063/1.4961287
Abstract
Doppler-free saturation spectroscopy provides a very powerful method to obtained detailed information about the electronic structure of the atom through measurement of the spectral line profile. This is achieved through a significant decrease in the Doppler broadening and essentially an elimination of the instrument broadening inherent to passive spectroscopic techniques. In this paper we will present the technique and associated physics of Doppler-free saturation spectroscopy in addition to how one selects the appropriate transition. Simulations of Hδ spectra will be presented to illustrate the increased sensitivity to both electric field and electron density measurements.
