- By:
- Cullen, David A; More, Karren L; Reeves, Kimberly S; Vernstrom, George; Atanasoska, Liliana; Haugen, Gregory; Atanasoski, Radoslav
- Publication Date:
- November 10, 2011
- Conference Name:
- 220th ECS Meeting and Electrochemical Energy Summit
- Conference Location:
- Boston, Massachusetts, United States of America
Abstract
The stability of Ru0.1Ir0.9 oxidation evolution reaction (OER) catalysts deposited on Pt-coated nanostructured thin films (NSTFs) has been investigated by aberration-corrected electron microscopy. Accelerated stress tests showed that the OER catalysts significantly improved the durability of the Pt under cell reversal conditions. High-resolution images of the end-of-life NSTFs showed significant Ir loss from the whisker surfaces, while no Pt loss was observed, indicating that the OER catalysts had protected the catalyst coated whisker surfaces from degradation.
