March 2026

Conference Paper

Constrained GAN-Generated X-Ray CT Data For Self-Supervised And Foundation-Model Segmentation Of Concrete Microstructures

By:
Ziabari, Amir K; Tabassum, Anika ; Gopalakrishnan Meena, Muralikrishnan ; Cheniour, Amani
Page Number:
1948-1953
Book Title:
2025 IEEE International Conference on Image Processing (ICIP)
Publication Date:
March 12, 2026
Publisher Location:
IEEE, New Jersey, United States of America
Conference Name:
2025 IEEE International Conference on Image Processing (ICIP)
Conference Location:
Anchorage, Alaska, United States of America
Conference Sponsor:
Various
View DOI Listing:
https://doi.org/10.1109/ICIP55913.2025.11084399

Abstract

Three-dimensional characterization of materials using X-ray computed tomography (XCT) is challenging due to the complexity of internal structures, noise, and variations in resolution. Traditional computer vision models often struggle to accurately segment these images, particularly in domain-specific applications like materials science. While supervised deep learning approaches have been developed to address the limitations of conventional algorithms, they typically require large amounts of labeled training data and often fail to generalize across different datasets. Self-supervised, few-and zero-shot learning methods have gained prominence in natural image processing and segmentation tasks, but their application to scientific imaging remains limited due to the unique structural complexity, noise, and textural artifacts present in materials science data. In this work, we investigate how domain adaptation, leveraging physics-based and GAN-generated synthetic data, impacts segmentation performance. We introduce a modified Contrastive Unpaired Translation (CUT) model designed to generate realistic labeled data, which can be used for training, pre-training, and fine-tuning segmentation models for real XCT microstructure data. We evaluate the performance of two segmentation approaches: a self-supervised network (SSL-ALPNet) and a foundation model (Segment Anything Model), assessing their improvements when pre-trained and/or fine-tuned on the synthesized data. Our results demonstrate that leveraging synthetic data significantly enhances segmentation performance, particularly in challenging materials science applications.