August 2025

Journal

Deep Learning Based Sinogram Inpainting for Fast and High-quality Artifact Correction in Electron Tomography

By:
Rahman, Obaidullah ; Singanallur Vaidyanathan, Venkatakrishnan ; Cullen, David A; Ziabari, Amir K
Journal Name:
Microscopy and Microanalysis
Page Number:
2203-2205
Volume:
31
Issue Number:
Supplement
Publication Date:
August 12, 2025
View DOI Listing:
https://doi.org/10.1093/mam/ozaf048.1081

Related Researchers