High Resolution X-Ray CT Reconstruction of Additively Manufactured Metal Parts using Generative Adversarial Network-based Domain Adaptation in AI-CT

By:: Ziabari, Amir K; Dubey, Abhishek K; Singanallur Vaidyanathan, Venkatakrishnan ; Frederick, Curtis L; Bingham, Philip R; Dehoff, Ryan R; Paquit, Vincent C
Journal Name:: Microscopy and Microanalysis
Page Number:: 2940-2942
Volume:: 27
Issue Number:: S1
Publication Date:: November 9, 2023
Conference Name:: Microscopy and Microanalysis
Conference Location:: Pittsburg, Pennsylvania, United States of America
Conference Sponsor:: Microscopy Society of America
View DOI Listing:: https://doi.org/10.1017/S1431927621010254

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