- By:
- He, Zichen; Kafle, Nischal ; Gebhart III, Gerald E; Biewer, Theodore M; Zhang, Zhili
- Journal Name:
- Review of Scientific Instruments
- Page Number:
- 113526
- Volume:
- 93
- Issue Number:
- 11
- Publication Date:
- November 9, 2023
- Conference Name:
- High-Temperature Plasma Diagnostics (HTPD)
- Conference Location:
- Rochester, New York, United States of America
- Conference Sponsor:
- NA
- View DOI Listing:
- https://doi.org/10.1063/5.0101835
Abstract
To fulfill the increasing needs of diagnostic support for researchers in plasma technology, a portable diagnostic package (PDP) equipped for both laser Thomson scattering (TS) and optical emission spectroscopy has been designed and constructed at Oak Ridge National Laboratory (ORNL), aiming to measure the temperature and number density of electrons and temperatures of ions in plasma devices. The PDP has been initially implemented on a high density and low temperature electrothermal arc source (ET-arc) at ORNL to test its TS capability. TS from the plasmas in the ET-arc has been obtained using the PDP. The electron temperature and number density were determined from TS spectra. These results were then compared to measurements from previous studies on the ET-arc. The TS diagnostic measured 0.8 ± 0.1, 1.3 ± 0.2, and 0.7 ± 0.1 eV and (4.4 ± 0.5) × 1021, (5.9 ± 0.7) × 1021, and (4.3 ± 0.5) x 1021 m-3, respectively, from three lines of sight that transect the plasma column.
