Multi-Modal Processing of Graphene Towards Precisely Controlled Fabrication of a Nanoelectronic Device Using the Helium Ion Microscope and the TOF SIMS

By:: Kim, Songkil ; Ievlev, Anton ; Vlassiouk, Ivan V; Burch, Matthew J; Sang, Xiahan ; Brown, Chance C; Unocic, Raymond R; Belianinov, Alex A; Jesse, Stephen ; Ovchinnikova, Olga S
Journal Name:: Microscopy and Microanalysis
Page Number:: 1720-1721
Volume:: 23
Issue Number:: S1
Publication Date:: November 9, 2023
Conference Name:: Microscopy & Microanalysis (M&M) 2017 Conference
Conference Location:: St. Louis, Missouri, United States of America
View DOI Listing:: https://doi.org/10.1017/S1431927617009266

Related Researchers