Multi-scale Low-dose Cryogenic TEM for Probing Beam-sensitive Thin-film Ionomer Variability Across Electrodes in Hydrogen Devices

By:: Oh, Juhyun ; Reeves, Kimberly S; van Cleve, Timothy; Cullen, David A; Zachman, Michael J
Journal Name:: Microscopy and Microanalysis
Page Number:: 671-672
Volume:: 31
Issue Number:: Supplement
Publication Date:: August 21, 2025
Conference Name:: Microscopy & Microanalysis
Conference Location:: Salt Lake City, Utah, United States of America
Conference Sponsor:: Microscopy Society of America
View DOI Listing:: https://doi.org/10.1093/mam/ozaf048.333

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