August 2025

Journal

Nanomechanical squeezing: Toward quantum imaging with atomic force microscopy

By:
Al-Sawai, Wael; Passian, Ali
Journal Name:
Physical Review A
Page Number:
13525-13525
Volume:
112
Issue Number:
1
Publication Date:
August 29, 2025
View DOI Listing:
https://doi.org/10.1103/1nnx-xc4r

Abstract

Leveraging quantum effects in mechanical oscillators promises major advancements in nanometrology, including sensing and imaging. Microscopic cantilevers serve as versatile force sensors with broad applications in nanoscience, nanotechnology, and, increasingly, quantum sensing. We theoretically model and investigate the quantum mechanics of cantilever probes in atomic force microscopy under conditions of reduced thermal noise. Specifically, our model captures the cantilever interaction with a surface via long-range attractive van der Waals forces and short-range repulsive-adhesive interactions described by the Derjaguin-Muller-Toporov model. We find that when the probe resides within the attractive interaction regime, a coherent state emerges, whereas, in the repulsive regime, a squeezed state forms for the cantilever's deformation state. Our calculations explain the functional role of interaction potentials in the quantum dynamics of macroscopic mechanical systems, which are proving useful in quantum sensing and information processing. The presented calculations can be extended to investigate other interaction forces relevant to atomic force microscopy.


Related Researchers