OFCnetLLM: Large Language Model for Network Monitoring and Alertness

By:: Yoon, Hong Jun ; Kiran, Mariam ; Ebling, Danial; Breen, Joe
Page Number:: 1-8
Book Title:: Proceedings of the 2025 ACM SIGMETRICS Conference on Measurement and Modeling of Computer Systems
Publication Date:: March 12, 2026
Publisher Location:: ACM, New York, United States of America
Conference Name:: ACM SIGMETRICS 2025 Workshop: AI Crossroads: Systems, Energy, and Applications
Conference Location:: Stony Brook, New York, United States of America
Conference Sponsor:: ACM
View DOI Listing:: https://doi.org/10.48550/arXiv.2507.22711

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