Precision Defect Engineering in 2D Materials via Automated STEM Atomic Fabrication

By:: Boebinger, Matthew G; Roccapriore, Kevin M; Ghosh, Ayana ; Xiao, Kai ; Lupini, Andrew R; Ziatdinov, Maxim; Kalinin, Sergei; Unocic, Raymond R
Journal Name:: Microscopy and Microanalysis
Page Number:: 357-358
Volume:: 30
Issue Number:: Supplement
Publication Date:: August 27, 2024
Conference Name:: 2024 Microscopy and Microanalysis Annual Meeting
Conference Location:: Cleveland, Ohio, United States of America
Conference Sponsor:: Microscopy Society of America and the Microanalysis Society
View DOI Listing:: https://doi.org/10.1093/mam/ozae044.163

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