Probing Structural and Chemical Short-Range Ordering in Fe5-xGeTe2 using 4D-STEM and EELS

By:: Ni, Haoyang ; Chi, Miaofang ; May, Andrew F; Zuo, Jian-Min
Journal Name:: Microscopy and Microanalysis
Page Number:: 1522-1524
Volume:: 30
Issue Number:: Supplement
Publication Date:: March 12, 2026
Conference Name:: Microscopy and Microanalysis 2024
Conference Location:: Cleveland, Ohio, United States of America
Conference Sponsor:: JEOL, Oxford Instruments, Melbuild, Diatome U.S., Ametek, Ted Pella. inc., Zeiss, Thermo Fisher Scientific, Dectris, Protochip, Tescan, Raith, Biophotonics
View DOI Listing:: https://doi.org/10.1093/mam/ozae044.752

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