March 2026

Conference Paper

ToF-SIMS Imaging and Analysis of Light Isotopes in Irradiated Materials

By:: Yu, Xiao-Ying ; Son, Jiyoung ; Terlier, Tanguy; Senor, David
Journal Name:: Microscopy and Microanalysis
Page Number:: 324-326
Volume:: 31
Publication Date:: March 12, 2026
Conference Name:: 2025 Microscopy and Microanalysis
Conference Location:: Salt Lake City, Utah, United States of America
Conference Sponsor:: American Society of Microscopy
View DOI Listing:: https://doi.org/10.1093/mam/ozaf048.169

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