Dr. Nelson is a TEM & STEM Electron Microscopist at ORNL since 2017. He received a BS in Electrical Engineering from the University of Virginia with a work-study internship in metrology at a Micron Inc. DRAM Fab. Following an interest in electronic materials he received a PhD in Materials Science from U. Michigan and was a post-doctoral researcher at the U.C. Berkeley / LBNL, specializing in (S)TEM characterization of complex oxides. His research expertise includes electronic materials, in-situ electrical biasing, electronic hardware and circuit design. This includes significant software development in hardware controls/detection and (S)TEM data analysis including raster distortion correction, atom finding, symmetry mapping, time dynamics, and AI Autoencoders (see github link).
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December 21, 2022
1 MIN READ
Conjoined charge density waves produce unconventional superconductivity in a Kagome metal