Dr. Rumy Petrova is a Technical Professional in Nuclear Security in the Applied Materials Analysis group within NND, NSSD, at Oak Ridge National Laboratory (ORNL). She earned her Ph.D. in Physics from the University of Central Florida (Orlando, FL).
Dr. Petrova’s background includes materials characterization and failure analysis; research and development supporting nano-optics and X-ray component manufacturing; and reliability and quality assurance. She has experience operating and maintaining advanced electron microscopy and ion-beam instrumentation, supporting the selection of state-of-the-art microscopes for purchase, and applying high-resolution imaging and analytical methods, including electron diffraction, energy-dispersive X-ray spectroscopy (EDS/EDX), and electron energy-loss spectroscopy (EELS). She has contributed to publications, presentations, and several patents.